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Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.

R. LavievilleTheano A. KaratsoriChristoforos G. TheodorouSylvain BarraudC. A. DimitriadisGérard Ghibaudo
Published in: ESSDERC (2016)
Keyphrases
  • data driven
  • databases
  • information theoretic
  • statistical information
  • global information
  • real time
  • information retrieval
  • decision trees
  • three dimensional
  • medical images
  • hypothesis testing
  • metal oxide