"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs.
Angeliki TataridouGérard GhibaudoChristoforos G. TheodorouPublished in: IRPS (2021)
Keyphrases
- detection method
- small number
- experimental evaluation
- main contribution
- high accuracy
- preprocessing
- significant improvement
- detection algorithm
- segmentation method
- dynamic programming
- computational complexity
- similarity measure
- cost function
- computational cost
- probabilistic model
- classification accuracy
- initial set
- mutual information
- feature extraction
- high precision
- optimization method
- face detection
- machine learning
- clustering method
- nano scale
- support vector machine svm
- computationally efficient
- feature set
- edge detection
- prior knowledge
- multiresolution
- objective function
- genetic algorithm