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Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

Christoforos G. TheodorouMouenes FadlallahXavier GarrosCharalambos A. DimitriadisGérard Ghibaudo
Published in: ESSDERC (2016)
Keyphrases
  • nano scale
  • power consumption
  • dynamic environments
  • noise reduction
  • low power
  • noise level
  • random noise
  • high speed
  • random access memory
  • low cost
  • input data
  • missing data
  • noisy environments
  • low voltage