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Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
Nikolaos P. Papadopoulos
Alkis A. Hatzopoulos
Dimitris K. Papakostas
C. A. Dimitriadis
Stilianos Siskos
Published in:
ISCAS (2006)
Keyphrases
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thin film
high density
white light interferometry
short circuit
grain size
electron microscopy
low density
multi layer
solar cell
database
room temperature
film thickness
chemical vapor deposition
data center
neural nets
plasma etching
data mining