Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.
N. ArpatzanisA. T. HatzopoulosDimitrios H. TassisC. A. DimitriadisFrançois TemplierMaher OudwanG. KamarinosPublished in: Microelectron. Reliab. (2008)