Ilgu Yun

Publication Activity (10 Years)

Years Active: 2004-2022
Publications (10 Years): 12

Top Topics

Silicon Nitride

Top Venues

Microelectron. Reliab.

IEEE Trans. Ind. Electron.

Publications

Seungju Hwang, Ilgu Yun
Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation. ICEIC (2022)
Min Soo Bae, Chuntaek Park, Ilgu Yun
Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime. SMACD (2018)
Sang Myung Lee, Ilgu Yun
Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications. PRIME (2018)
Chuntaek Park, Ilgu Yun
Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation. Microelectron. Reliab. (2017)
Sang Myung Lee, Ilgu Yun
Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistor characteristics under dynamic mechanical stress. Microelectron. Reliab. (2017)
Dongseok Shin, Byungchoul Park, Youngcheol Chae, Ilgu Yun
Structure variation effects on device reliability of single photon avalanche diodes. Microelectron. Reliab. (2017)
Sang Myung Lee, Chuntaek Park, Ilgu Yun
Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors. Microelectron. Reliab. 64 (2016)
In Joong Kim, Ilgu Yun
Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens. IEEE Trans. Ind. Electron. 63 (9) (2016)
Dongseok Shin, Min Soo Bae, Ilgu Yun
Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display. Microelectron. Reliab. 64 (2016)
Jun Yeong Lim, Ilgu Yun
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices. Microelectron. Reliab. 55 (9-10) (2015)
Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun
An analytical avalanche breakdown model for double gate MOSFET. Microelectron. Reliab. 55 (1) (2015)
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. Microelectron. Reliab. 55 (5) (2015)
Jung Han Kang, Edward Namkyu Cho, Ilgu Yun
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54 (9-10) (2014)
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53 (9-11) (2013)
Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. Expert Syst. Appl. 39 (10) (2012)
Mingu Kang, Ilgu Yun
Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Suehye Park, Edward Namkyu Cho, Ilgu Yun
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. Microelectron. Reliab. 52 (9-10) (2012)
Edward Namkyu Cho, Jung Han Kang, Ilgu Yun
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. Microelectron. Reliab. 51 (9-11) (2011)
Chang Eun Kim, Pyung Moon, Ilgu Yun, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications. Expert Syst. Appl. 38 (3) (2011)
Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun
Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests. Microelectron. Reliab. 49 (1) (2009)
Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms. Expert Syst. Appl. 36 (2) (2009)
Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, Ilgu Yun
Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates. Expert Syst. Appl. 35 (3) (2008)
Han Sung Joo, Sang-Wan Ryu, Jeha Kim, Ilgu Yun
Degradation analysis in asymmetric sampled grating distributed feedback laser diodes. Microelectron. J. 38 (6-7) (2007)
Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun
thin film characteristics using Latin Hypercube Sampling. Expert Syst. Appl. 32 (2) (2007)
Young-Don Ko, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun
Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics. Artificial Intelligence and Applications (2007)
Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun
PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition. ISNN (2) (2006)
Myoung-Seok Kim, Young-Don Ko, Tae-Houng Moon, Jae-Min Myoung, Ilgu Yun
thin films grown by metal-organic molecular beam epitaxy. Microelectron. J. 37 (2) (2006)
Byung In Moon, Hongil Yoon, Ilgu Yun, Sungho Kang
An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT (2004)
Bongyong Lee, Hongil Yoon, Kyung Sook Hyun, Yong Hwan Kwon, Ilgu Yun
Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers. Microelectron. J. 35 (8) (2004)