Jun Yeong Lim

Publication Activity (10 Years)

Years Active: 2013-2015
Publications (10 Years): 0

Top Topics

Emotional Intelligence

Dielectric Constant

Structural Analysis

Top Venues

Microelectron. Reliab.

Publications

Jun Yeong Lim, Ilgu Yun
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices. Microelectron. Reliab. 55 (9-10) (2015)
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. Microelectron. Reliab. 55 (5) (2015)
Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53 (9-11) (2013)