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Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests.
Keun Ho Rhew
Su Chang Jeon
Dae Hee Lee
Byueng-Su Yoo
Ilgu Yun
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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reliability assessment
high temperature
silicon dioxide
bp neural network model
power system
space charge
impurity atom
d objects
diffusion process
machine learning
range data
three dimensional
artificial intelligence
object surface
optical properties
simulation model
medical images
high speed