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Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress.
Jung Han Kang
Edward Namkyu Cho
Ilgu Yun
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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thin film
high density
short circuit
silicon nitride
grain size
solar cell
neural network
multi layer
electron microscopy
white light interferometry
database
data center
fuzzy logic
cost effective
low density
plasma etching