An analytical avalanche breakdown model for double gate MOSFET.
Edward Namkyu ChoYong-Hyeon ShinIlgu YunPublished in: Microelectron. Reliab. (2015)
Keyphrases
- high level
- objective function
- sensitivity analysis
- theoretical analysis
- data mining
- machine learning
- case study
- prior knowledge
- formal model
- management system
- mathematical model
- network model
- neural network
- bayesian framework
- experimental data
- process model
- computational model
- probability distribution
- probabilistic model
- cost function
- artificial intelligence