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Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation.
Chuntaek Park
Ilgu Yun
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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thin film
database
databases
probabilistic model
generation process
wireless sensor networks
learning tasks
simulation model
multi layer
high density