Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain.
Jong Hoon LeeSeul Ki YuJae Won KimMin-Ju AhnWon-Ju ChoJong-Tae ParkPublished in: Microelectron. Reliab. (2016)
Keyphrases
- thin film
- high density
- low density
- grain size
- short circuit
- solar cell
- multi layer
- single image
- illumination conditions
- low power
- room temperature
- electron microscopy
- lighting conditions
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- learning algorithm
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- neural network