Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layer.
Sang Min KimMin-Soo KangWon-Ju ChoJong-Tae ParkPublished in: Microelectron. Reliab. (2017)
Keyphrases
- thin film
- high density
- multi layer
- short circuit
- electron microscopy
- grain size
- room temperature
- low density
- single image
- solar cell
- illumination conditions
- integrated circuit
- neural network
- lighting conditions
- data center
- decision making
- low power
- transaction costs
- power consumption
- knowledge discovery
- artificial neural networks
- space charge
- chemical vapor deposition
- database
- white light interferometry