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Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs.

Sung Jun JangDae Hyun KaChong-Gun YuKwan-Su KimWon-Ju ChoJong-Tae Park
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • comparative study
  • edge strength
  • database
  • computer vision
  • decision trees
  • feature extraction
  • film thickness