Chong-Gun Yu

Publication Activity (10 Years)

Years Active: 1993-2018
Publications (10 Years): 3

Top Topics

Field Effect Transistors

Tracking Control

Gate Dielectrics

Top Venues

Microelectron. Reliab.

Frontiers Inf. Technol. Electron. Eng.

Publications

Eun-Jung Yoon, Jong-Tae Park, Chong-Gun Yu
Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications. Frontiers Inf. Technol. Electron. Eng. 19 (2) (2018)
Jin Hyung Choi, Chong-Gun Yu, Jong-Tae Park
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectron. Reliab. 64 (2016)
Hyun Jun Jang, Chong-Gun Yu, Jong-Tae Park
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. Microelectron. Reliab. 64 (2016)
Jae Hoon Lee, Jin-Woo Han, Chong-Gun Yu, Jong-Tae Park
Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong-Tae Park
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectron. Reliab. 54 (9-10) (2014)
Hyun Jun Jang, Seung Min Lee, Chong-Gun Yu, Jong-Tae Park
A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors. Microelectron. Reliab. 53 (9-11) (2013)
Seung Min Lee, Chong-Gun Yu, Seung Min Jeong, Won-Ju Cho, Jong-Tae Park
Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Jin-Young Kim, Chong-Gun Yu, Jong-Tae Park
Effects of device layout on the drain breakdown voltages in MuGFETs. Microelectron. Reliab. 51 (9-11) (2011)
Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu, Won-Ju Cho, M. Saif Islam, Jong-Tae Park
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. Microelectron. Reliab. 49 (9-11) (2009)
Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong-Tae Park
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. Microelectron. Reliab. 47 (9-11) (2007)
In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectron. Reliab. 46 (9-11) (2006)
Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong-Tae Park, Jean-Pierre Colinge
Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. Microelectron. Reliab. 44 (9-11) (2004)
Jong-Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectron. Reliab. 43 (9-11) (2003)
Chong-Gun Yu, Randall L. Geiger
An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers. IEEE J. Solid State Circuits 29 (5) (1994)
Chong-Gun Yu, Randall L. Geiger
An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors. ISCAS (1994)
Chong-Gun Yu, Randall L. Geiger
Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor. ISCAS (1993)