Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.
Jin Hyung ChoiJin-Woo HanChong-Gun YuJong-Tae ParkPublished in: Microelectron. Reliab. (2014)
Keyphrases
- cmos technology
- low voltage
- silicon dioxide
- field effect transistors
- leakage current
- low power
- high density
- parallel processing
- gate dielectrics
- power consumption
- semiconductor devices
- metal oxide semiconductor
- steady state
- nano scale
- power dissipation
- high speed
- multiple input
- image sensor
- databases
- mathematical analysis
- low cost
- color images
- real world
- neural network