Jin Hyung Choi

Publication Activity (10 Years)

Years Active: 2014-2016
Publications (10 Years): 1

Top Topics

Semiconductor Devices

Pointwise Mutual Information

Gate Dielectrics

Top Venues

Microelectron. Reliab.

Publications

Jin Hyung Choi, Chong-Gun Yu, Jong-Tae Park
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectron. Reliab. 64 (2016)
Jin Hyung Choi, Jong-Tae Park
Wire width dependence of hot carrier degradation in silicon nanowire gate-all-around MOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong-Tae Park
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectron. Reliab. 54 (9-10) (2014)