Se Re Na Yun

Publication Activity (10 Years)

Years Active: 2003-2006
Publications (10 Years): 0

Publications

In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectron. Reliab. 46 (9-11) (2006)
Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong-Tae Park, Jean-Pierre Colinge
Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. Microelectron. Reliab. 44 (9-11) (2004)
Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong-Tae Park
Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. Microelectron. Reliab. 43 (9-11) (2003)