Seok Hee Jeon

Publication Activity (10 Years)

Years Active: 2003-2005
Publications (10 Years): 0

Publications

Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong-Tae Park
Reliability improvement by the suppression of keyhole generation in W-plug vias. Microelectron. Reliab. 45 (9-11) (2005)
Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong-Tae Park, Jean-Pierre Colinge
Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. Microelectron. Reliab. 44 (9-11) (2004)
Jong-Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectron. Reliab. 43 (9-11) (2003)