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Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures.

Se Re Na YunWon Sub ParkByung Ha LeeJong-Tae Park
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • electric field
  • space charge
  • multi channel
  • multiple access
  • electrical properties
  • metal oxide
  • three dimensional
  • communication channels
  • transmission line