Login / Signup
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.
In Kyung Lee
Se Re Na Yun
Kyosun Kim
Chong-Gun Yu
Jong-Tae Park
Published in:
Microelectron. Reliab. (2006)
Keyphrases
</>
experimental findings
high density
power consumption
real time
bayesian networks
machine learning
integrated circuit
circuit design