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New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.

In Kyung LeeSe Re Na YunKyosun KimChong-Gun YuJong-Tae Park
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • experimental findings
  • high density
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  • bayesian networks
  • machine learning
  • integrated circuit
  • circuit design