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NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer.

Yong Woo JeonDae Hyun KaChong-Gun YuWon-Ju ChoM. Saif IslamJong-Tae Park
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • silicon on insulator
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  • cmos technology
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  • ibm power processor