Hyun Jun Jang

Publication Activity (10 Years)

Years Active: 2007-2016
Publications (10 Years): 1

Top Topics

Field Effect Transistors

Positive Effects

Top Venues

Microelectron. Reliab.

Publications

Hyun Jun Jang, Chong-Gun Yu, Jong-Tae Park
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. Microelectron. Reliab. 64 (2016)
Hyun Jun Jang, Seung Min Lee, Chong-Gun Yu, Jong-Tae Park
A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors. Microelectron. Reliab. 53 (9-11) (2013)
Seung Min Lee, Hyun Jun Jang, Jong-Tae Park
Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors. Microelectron. Reliab. 53 (9-11) (2013)
Hyun Jun Jang, Dae Won Hwang, Eul-Gyu Im
Data Protection in Memory Using Byte Reordering. ISI Workshops (2008)
Eul-Gyu Im, Jung Sik Kim, In Woo Noh, Hyun Jun Jang
A Hybrid Model for Worm Simulations in a Large Network. PAISI (2007)