Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors.
Seung Min LeeHyun Jun JangJong-Tae ParkPublished in: Microelectron. Reliab. (2013)
Keyphrases
- field effect transistors
- cmos technology
- steady state
- high density
- low power
- nano scale
- multiple input
- mathematical analysis
- databases
- information systems
- power consumption
- positive effects
- high impact
- negative effects
- metal oxide semiconductor
- database
- negative impact
- markov chain
- data structure
- bayesian networks
- data sets