EDGE STRENGTH
Experts
- Jovisa D. Zunic
- Georgios C. Georgiou
- Christos Xenophontos
- Sibel Tari
- Milos Stojmenovic
- Miltiades Elliotis
- Gang Wang
- Bernard De Baets
- Yuta Nozaki
- Haisheng Tan
- Erkut Erdem
- Yi Lu
- Jesper Jansson
- Kenta Ozeki
- Xiang-Yang Li
- Weizhou Liu
- Ibrahim Pekkucuksen
- Naonori Kakimura
- Ying He
- Eiji Miyano
- Zhuzhong Qian
- Tarik Taleb
- Mario Valencia-Pabon
- Ching-Liang Su
- Vlady Ravelomanana
- Haruko Okamura
- Yuan Gao
- Xingfei Xue
- Behnaz Pourmohseni
- Weifa Liang
- Yusuke Kobayashi
- Xingce Wang
- Zhongke Wu
- Jiawei Zhang
- Thomas Fahringer
- Haichuan Zhao
- Shun-ichi Maezawa
- Biswanath Mukherjee
- Gabriele Russo Russo
Venues
- CoRR
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- Discret. Appl. Math.
- IEEE Trans. Mob. Comput.
- ICASSP
- Appl. Math. Comput.
- Discret. Math.
- ISCAS
- IEEE Access
- Pattern Recognit.
- GLOBECOM
- IEEE Signal Process. Lett.
- Pattern Recognit. Lett.
- Comput. Geosci.
- ICIP
- IEEE Trans. Netw. Serv. Manag.
- PReMI
- IEEE Trans. Ind. Informatics
- Medical Biol. Eng. Comput.
- J. Comput. Chem.
- J. Graph Theory
- CVPR
- IGARSS
- Ars Comb.
- NIPS
- J. Math. Imaging Vis.
- EUSIPCO
- Microelectron. Reliab.
- ICIP (3)
- IEEE Internet Things J.
- DAGM-Symposium
- SIAM J. Numer. Anal.
- CVPR Workshops
- IEEE Trans. Instrum. Meas.
- Proc. IEEE
- Electron. J. Comb.
- ISVC (2)
- Int. J. Mach. Learn. Cybern.
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