EDGE STRENGTH
Experts
- Jovisa D. Zunic
- Georgios C. Georgiou
- Sibel Tari
- Christos Xenophontos
- Gang Wang
- Milos Stojmenovic
- Miltiades Elliotis
- Bernard De Baets
- Haruko Okamura
- Erkut Erdem
- Vlady Ravelomanana
- Weifa Liang
- Yi Lu
- Thomas Fahringer
- Yuni Iwamasa
- Takehiro Ito
- Liuyan Liu
- Kan Wang
- Yusuke Kobayashi
- Shun-ichi Maezawa
- Gabriele Russo Russo
- Eiji Miyano
- Xuande Zhang
- Ibrahim Pekkucuksen
- Evgenia Christodoulou
- Yoshio Okamoto
- Francesco Lo Presti
- Yuta Nozaki
- António M. G. Pinheiro
- Jean Cardinal
- Jesper Jansson
- Tiziana Mannucci
- Tibor Lukic
- Hao Yu
- Kenta Ozeki
- Hirotaka Ono
- Naonori Kakimura
- Biswanath Mukherjee
- Yuichi Asahiro
Venues
- CoRR
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- Discret. Appl. Math.
- Appl. Math. Comput.
- ICASSP
- ISCAS
- IEEE Trans. Netw. Serv. Manag.
- Pattern Recognit.
- IEEE Access
- Discret. Math.
- IEEE Signal Process. Lett.
- ICIP
- Comput. Geosci.
- Pattern Recognit. Lett.
- PReMI
- IGARSS
- SIAM J. Numer. Anal.
- IEEE Internet Things J.
- Proc. IEEE
- Medical Biol. Eng. Comput.
- Microelectron. Reliab.
- Ars Comb.
- IEEE Trans. Ind. Informatics
- IEEE Trans. Mob. Comput.
- J. Math. Imaging Vis.
- EUSIPCO
- DAGM-Symposium
- J. Comput. Chem.
- NIPS
- Electron. J. Comb.
- ICIP (3)
- CVPR
- J. Graph Theory
- CVPR Workshops
- CCCG
- Parallel Process. Lett.
- ICAR
- PERCOM
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