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Device instability of amorphous InGaZnO thin film transistors with transparent source and drain.
Sang Min Kim
Min-Ju Ahn
Won-Ju Cho
Jong-Tae Park
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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thin film
high density
field effect transistors
short circuit
solar cell
low density
grain size
multi layer
electron microscopy
genetic algorithm
power consumption
integrated circuit
white light interferometry
database
film thickness
room temperature
early warning
single view
low power
high speed