SINGLE VIEW
Experts
- Changqing Zhang
- Shiliang Sun
- Luc Van Gool
- Philip S. Yu
- Feiping Nie
- Dacheng Tao
- Marc Pollefeys
- Jihua Zhu
- Roberto Cipolla
- Chang-Dong Wang
- Miki Haseyama
- Takahiro Ogawa
- Pascal Fua
- Nassir Navab
- Zhongyu Li
- Hans-Peter Seidel
- Yebin Liu
- Hongbin Zha
- Guoyan Zheng
- Qinghua Hu
- Hideo Saito
- Ioannis Pitas
- Qionghai Dai
- Daniel Cremers
- E. Eugene Schultz
- Alexandros Iosifidis
- Xiao-Yuan Jing
- Dinggang Shen
- Alessio Del Bue
- Thomas S. Huang
- Christian Theobalt
- Andrew Zisserman
- Jean Ponce
- Ling Shao
- Weizhi Nie
- Xuelong Li
- Zhao Kang
- Toshiro Nunome
- Lifang He
Venues
- CoRR
- CVPR
- Sensors
- ICIP
- IEEE Access
- ICCV
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Neurocomputing
- AAAI
- Pattern Recognit.
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- BMVC
- IROS
- ICASSP
- Int. J. Comput. Vis.
- CVPR Workshops
- Knowl. Based Syst.
- Expert Syst. Appl.
- Inf. Sci.
- IJCAI
- ACM Multimedia
- Image Vis. Comput.
- ICME
- Appl. Intell.
- Pattern Recognit. Lett.
- IJCNN
- Remote. Sens.
- ISBI
- IEEE Trans. Instrum. Meas.
- Comput. Graph. Forum
- WACV
- EMBC
- 3DV
- Comput. Vis. Image Underst.
- IEEE Trans. Knowl. Data Eng.
- IGARSS
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