Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics.
Seul Ki LeeSung Il HongYeon Ho LeeSe Won LeeWon-Ju ChoJong-Tae ParkPublished in: Microelectron. Reliab. (2012)
Keyphrases
- comparative study
- thin film
- high density
- electrical properties
- short circuit
- gate dielectrics
- field effect transistors
- film thickness
- low density
- solar cell
- equivalent circuit
- grain size
- plasma etching
- neural network
- si sio
- electron microscopy
- circuit design
- integrated circuit
- multi layer
- power consumption
- chemical vapor deposition
- genetic algorithm
- transmission line
- low power
- low cost
- control system
- database