Ki-Don Lee

Publication Activity (10 Years)

Years Active: 2002-2024
Publications (10 Years): 8

Top Topics

Confirmatory Factor Analysis

Polarity Classification

Top Venues

Publications

Yinghong Zhao, Hokyung Park, Ki-Don Lee, Liangshan Chen, Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim, Myungsoo Yeo, Shin-Young Chung, Ju Kwang Kim
Impacts of Post-Cu CMP Queue Time on Reliability. IRPS (2024)
Rakesh Ranjan, Pavitra R. Perepa, Ki-Don Lee, Ashish Kumar Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang, Peter Kim, Kwanjae Song, Yongwoo Jeon, Seungho Kim, Hyewon Shim, Shin-Young Chung, Ju Kwang Kim
A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation. IRPS (2024)
Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner
Polarity Dependency of MOL-TDDB in FinFET. IRPS (2023)
Rakesh Ranjan, Pavitra Ramadevi Perepa, Ki-Don Lee, Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi, Jon Haefner, Caleb Dongkyun Kwon, Minjung Jin, Wenhao Zhou, Hyewon Shim, Shin-Young Chung
Impact of Barrier Metal Thickness on SRAM Reliability. IRPS (2023)
Yinghong Zhao, Ki-Don Lee, Manisha Sharma, Joonah Yoon, Rakesh Ranjan, Md Iqbal Mahmud, Caleb Dongkyan Kwon, Myungsoo Yeo
Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application. IRPS (2022)
Md Iqbal Mahmud, Rakesh Ranjan, Ki-Don Lee, Pavitra Ramadevi Perepa, Caleb Dongkyun Kwon, Seungjin Choo, Kihyun Choi
Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET. IRPS (2022)
Rakesh Ranjan, Ki-Don Lee, Md Iqbal Mahmud, Mohammad Shahriar Rahman, Pavitra Ramadevi Perepa, Charles Briscoe LaRow, Caleb Dongkyun Kwon, Maihan Nguyen, Minhyo Kang, Ashish Kumar Jha, Ahmed Shariq, Shamas Musthafa Ummer, Susannah Laure Prater, Hyunchul Sagong, HwaSung Rhee
Systematic Study of Process Impact on FinFET Reliability. IRPS (2021)
Rakesh Ranjan, Charles B. LaRow, Ki-Don Lee, Minhyo Kang, Pavitra R. Perepa, Md. Shahriar Rahman, Bong Ki Lee, David Moreau, Carolyn Cariss-Daniels, Timothy Basford, Colby Callahan, Maihan Nguyen, Gil Heyun Choi, Hyunchul Sagong, HwaSung Rhee
Trap Density Modulation for IO FinFET NBTI Improvement. IRPS (2020)
Ennis T. Ogawa, Ki-Don Lee, Volker A. Blaschke, Paul S. Ho
Electromigration reliability issues in dual-damascene Cu interconnections. IEEE Trans. Reliab. 51 (4) (2002)