Trap Density Modulation for IO FinFET NBTI Improvement.
Rakesh RanjanCharles B. LaRowKi-Don LeeMinhyo KangPavitra R. PerepaMd. Shahriar RahmanBong Ki LeeDavid MoreauCarolyn Cariss-DanielsTimothy BasfordColby CallahanMaihan NguyenGil Heyun ChoiHyunchul SagongHwaSung RheePublished in: IRPS (2020)