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Systematic Study of Process Impact on FinFET Reliability.

Rakesh RanjanKi-Don LeeMd Iqbal MahmudMohammad Shahriar RahmanPavitra Ramadevi PerepaCharles Briscoe LaRowCaleb Dongkyun KwonMaihan NguyenMinhyo KangAshish Kumar JhaAhmed ShariqShamas Musthafa UmmerSusannah Laure PraterHyunchul SagongHwaSung Rhee
Published in: IRPS (2021)
Keyphrases
  • confirmatory factor analysis
  • data sets
  • real time
  • neural network
  • website
  • case study
  • database systems
  • bayesian networks
  • learning environment
  • empirical studies
  • simulation study
  • factors affecting
  • process control