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Impact of Barrier Metal Thickness on SRAM Reliability.

Rakesh RanjanPavitra Ramadevi PerepaKi-Don LeeHokyung ParkPeter KimGanesh Chakravarthy YerubandiJon HaefnerCaleb Dongkyun KwonMinjung JinWenhao ZhouHyewon ShimShin-Young Chung
Published in: IRPS (2023)
Keyphrases
  • power consumption
  • databases
  • grain size
  • high impact
  • data sets
  • information systems
  • e learning
  • data structure
  • x ray