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Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.

Changze LiuHyun-Chul SagongHyejin KimSeungjin ChooHyunwoo LeeYoohwan KimHyunjin KimBisung JoMinjung JinJinjoo KimSangsu HaSangwoo PaeJongwoo Park
Published in: IRPS (2015)
Keyphrases
  • learning algorithm
  • data sets
  • statistical analysis
  • database
  • machine learning
  • decision trees