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Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs.
Seongkyung Kim
Hyerim Park
Eunyu Choi
Young Han Kim
Dahyub Kim
Hyewon Shim
Shin-Young Chung
Paul Jung
Published in:
IRPS (2023)
Keyphrases
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reliability assessment
bp neural network model
power system
multi channel
key technologies
case study
data processing
modal logic
rapid development
multiple access
neural network
classical logic
predicate logic
cmos technology