Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS.

Wei Chun Wang Shida Zhang Sudarshan Sharma Minah Lee Saibal Mukhopadhyay

Published in: IRPS (2024)

Keyphrases

analog vlsi
circuit design
analog to digital converter
cmos technology
high speed
vlsi circuits
mixed signal
low cost
nm technology
power consumption
low power
focal plane
data acquisition
main memory
limited memory
random access memory
memory size
neural network
memory usage
infrared
signal processing
data structure