Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM.
Devanarayanan EttisserryAngelo ViscontiMauro BonanomiRiccardo PazzoccoAndrea LocatelliAlessandro SebastianiAshonita ChavanMatthew HollanderGiorgio ServalliAlessandro CalderoniNirmal RamaswamyPublished in: IRPS (2024)