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Hole-Induced Threshold Voltage Instability Under High Positive and Negative Gate Stress in SiC MOSFETs.
Ayan K. Biswas
Daniel J. Lichtenwalner
Jae-Hyung Park
Brett Hull
Satyaki Ganguly
Donald A. Gajewski
Elif Balkas
Published in:
IRPS (2024)
Keyphrases
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positive and negative
low voltage
decision rules
positive or negative
training instances
power system
short circuit
cmos technology
positive examples
data mining
neural network
active learning
target concept
data analysis
genetic algorithm
field effect transistors
data sets