Brett Hull

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 5

Top Topics

Evaluation Method

Electric Power Systems

High Temperature

Reliability Assessment

Top Venues

Publications

Ayan K. Biswas, Daniel J. Lichtenwalner, Jae-Hyung Park, Brett Hull, Satyaki Ganguly, Donald A. Gajewski, Elif Balkas
Hole-Induced Threshold Voltage Instability Under High Positive and Negative Gate Stress in SiC MOSFETs. IRPS (2024)
In-Hwan Ji, Anoop Mathew, Jae-Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. IRPS (2023)
Satyaki Ganguly, Daniel J. Lichtenwalner, Caleb Isaacson, Donald A. Gajewski, Philipp Steinmann, Ryan Foarde, Brett Hull, Sei-Hyung Ryu, Scott Allen, John W. Palmour
Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs. IRPS (2022)
Daniel J. Lichtenwalner, Brett Hull, Edward Van Brunt, Shadi Sabri, Donald A. Gajewski, Dave Grider, Scott Allen, John W. Palmour, Akin Akturk, James McGarrity
Reliability studies of SiC vertical power MOSFETs. IRPS (2018)
Akin Akturk, James McGarrity, Neil Goldsman, Daniel J. Lichtenwalner, Brett Hull, Dave Grider, Richard Wilkins
The effects of radiation on the terrestrial operation of SiC MOSFETs. IRPS (2018)