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In-Hwan Ji
Publication Activity (10 Years)
Years Active: 2006-2023
Publications (10 Years): 2
Top Topics
Reliability Assessment
High Temperature
Evaluation Method
Power Distribution Systems
Top Venues
IRPS
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Publications
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In-Hwan Ji
,
Anoop Mathew
,
Jae-Hyung Park
,
Neal Oldham
,
Matthew McCain
,
Shadi Sabri
,
Edward Van Brunt
,
Brett Hull
,
Daniel J. Lichtenwalner
,
Donald A. Gajewski
,
John W. Palmour
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes.
IRPS
(2023)
Kevin Matocha
,
In-Hwan Ji
,
Xuning Zhang
,
Sauvik Chowdhury
SiC Power MOSFETs: Designing for Reliability in Wide-Bandgap Semiconductors.
IRPS
(2019)
In-Hwan Ji
,
Min-Woo Ha
,
Young-Hwan Choi
,
Seung-Chul Lee
,
Chong-Man Yun
,
Min-Koo Han
A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor.
Microelectron. J.
39 (6) (2008)
In-Hwan Ji
,
Byung-Chul Jeon
,
Young-Hwan Choi
,
Yearn-Ik Choi
,
Min-Koo Han
A New Emitter Switched Thyristor (EST) employing Trench Segmented p-base.
Microelectron. J.
37 (3) (2006)