John W. Palmour

Publication Activity (10 Years)

Years Active: 1991-2023
Publications (10 Years): 4

Top Topics

High Temperature

Electric Power Systems

Evaluation Method

Reliability Assessment

Top Venues

Publications

In-Hwan Ji, Anoop Mathew, Jae-Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. IRPS (2023)
Satyaki Ganguly, Kyle M. Bothe, Alexandre Niyonzima, Thomas Smith, Yueying Liu, Jeremy Fisher, Fabian Radulescu, Donald A. Gajewski, Scott T. Sheppard, Jim W. Milligan, Basim Noori, John W. Palmour
DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited). IRPS (2022)
Satyaki Ganguly, Daniel J. Lichtenwalner, Caleb Isaacson, Donald A. Gajewski, Philipp Steinmann, Ryan Foarde, Brett Hull, Sei-Hyung Ryu, Scott Allen, John W. Palmour
Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs. IRPS (2022)
Daniel J. Lichtenwalner, Brett Hull, Edward Van Brunt, Shadi Sabri, Donald A. Gajewski, Dave Grider, Scott Allen, John W. Palmour, Akin Akturk, James McGarrity
Reliability studies of SiC vertical power MOSFETs. IRPS (2018)
R. Chris Clarke, John W. Palmour
SiC microwave power technologies. Proc. IEEE 90 (6) (2002)
Robert F. Davis, Galina Kelner, Michael S. Shur, John W. Palmour, John A. Edmond
Thin film deposition and microelectronic and optoelectronic device fabrication and characterization in monocrystalline alpha and beta silicon carbide. Proc. IEEE 79 (5) (1991)