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DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited).

Satyaki GangulyKyle M. BotheAlexandre NiyonzimaThomas SmithYueying LiuJeremy FisherFabian RadulescuDonald A. GajewskiScott T. SheppardJim W. MilliganBasim NooriJohn W. Palmour
Published in: IRPS (2022)
Keyphrases
  • reliability assessment
  • databases
  • machine learning
  • image reconstruction
  • bp neural network model
  • database
  • real time
  • social networks
  • decision trees
  • binary images