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Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs.

Satyaki GangulyDaniel J. LichtenwalnerCaleb IsaacsonDonald A. GajewskiPhilipp SteinmannRyan FoardeBrett HullSei-Hyung RyuScott AllenJohn W. Palmour
Published in: IRPS (2022)
Keyphrases
  • positive and negative
  • multi channel
  • evaluation process
  • real time
  • data sets
  • power consumption
  • evaluation method
  • evaluation criteria
  • multiple input
  • multiple access