Scott Allen

Publication Activity (10 Years)

Years Active: 2018-2022
Publications (10 Years): 2

Top Topics

Reliability Assessment

Evaluation Process

Top Venues

Publications

Satyaki Ganguly, Daniel J. Lichtenwalner, Caleb Isaacson, Donald A. Gajewski, Philipp Steinmann, Ryan Foarde, Brett Hull, Sei-Hyung Ryu, Scott Allen, John W. Palmour
Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs. IRPS (2022)
Daniel J. Lichtenwalner, Brett Hull, Edward Van Brunt, Shadi Sabri, Donald A. Gajewski, Dave Grider, Scott Allen, John W. Palmour, Akin Akturk, James McGarrity
Reliability studies of SiC vertical power MOSFETs. IRPS (2018)