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High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes.

In-Hwan JiAnoop MathewJae-Hyung ParkNeal OldhamMatthew McCainShadi SabriEdward Van BruntBrett HullDaniel J. LichtenwalnerDonald A. GajewskiJohn W. Palmour
Published in: IRPS (2023)
Keyphrases
  • high temperature
  • wide range
  • high precision
  • data acquisition
  • evaluation method
  • high reliability
  • data sets
  • databases
  • information systems
  • low cost
  • gold standard
  • evaluation methods
  • failure rate