High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes.
In-Hwan JiAnoop MathewJae-Hyung ParkNeal OldhamMatthew McCainShadi SabriEdward Van BruntBrett HullDaniel J. LichtenwalnerDonald A. GajewskiJohn W. PalmourPublished in: IRPS (2023)