Pablo Saraza-Canflanca

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 23

Top Topics

Tamper Detection

Design Considerations

Reservoir Computing

Pareto Optimality

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Alex Romano-Molar, Erik Bury, Robin Degraeve, Ben Kaczer
Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology. IRPS (2024)
Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. IRPS (2024)
Y. Guo, R. Degraeve, Michiel Vandemaele, Pablo Saraza-Canflanca, Jacopo Franco, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
Exploiting Bias Temperature Instability for Reservoir Computing in Edge Artificial Intelligence Applications. IRPS (2024)
Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. IRPS (2023)
Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array. SMACD (2023)
Javier Diaz-Fortuny, Dishant Sangani, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, Ben Kaczer
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation. IRPS (2023)
Francisco V. Fernández, Elisenda Roca, Pablo Saraza-Canflanca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. SMACD (2023)
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Andrea Vici, Erik Bury, Robin Degraeve, Ben Kaczer
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology. IRPS (2023)
Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise. IEEE Trans. Instrum. Meas. 71 (2022)
Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs. Integr. 85 (2022)
Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation. SMACD (2022)
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury, Michiel Vandemaele, Ben Kaczer, Robin Degraeve
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability. IRPS (2022)
Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Andrés Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies. IRPS (2022)
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. Integr. 72 (2020)
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits. IEEE Trans. Instrum. Meas. 69 (3) (2020)
Pablo Saraza-Canflanca, H. Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
Improving the reliability of SRAM-based PUFs in the presence of aging. DTIS (2020)
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. DATE (2019)
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level. SMACD (2019)
G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. IRPS (2019)
Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. DATE (2019)
Pablo Saraza-Canflanca, D. Malagon, Fábio Passos, A. Toro, Juan Núñez, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models. SMACD (2018)
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. SMACD (2018)
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
Automated Massive RTN Characterization Using a Transistor Array Chip. SMACD (2018)