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Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays.

Pablo Saraza-CanflancaDishant SanganiJavier Diaz-FortunyStanislav TyaginovGeorges G. E. GielenErik BuryBen Kaczer
Published in: IRPS (2024)
Keyphrases
  • statistical analysis
  • state space
  • data driven
  • machine learning
  • information retrieval
  • computer vision
  • case study
  • database systems
  • mobile robot
  • line drawings