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A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level.

Pablo Saraza-CanflancaJavier Diaz-FortunyRafael Castro-LópezElisenda RocaJavier Martín-MartínezRosana RodríguezMontserrat NafríaFrancisco V. Fernández
Published in: Integr. (2020)
Keyphrases
  • neural network
  • higher level
  • database
  • databases
  • information retrieval
  • information systems
  • knowledge base
  • case study
  • bayesian networks
  • high speed
  • statistical analysis
  • computationally efficient
  • analysis tool