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A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation.

Pablo Saraza-CanflancaJavier Martín-MartínezElisenda RocaRafael Castro-LópezRosana RodríguezMontserrat NafríaFrancisco V. Fernández
Published in: SMACD (2022)
Keyphrases
  • stock market
  • image processing
  • parameter estimation
  • input parameters
  • database
  • real world
  • digital libraries
  • expert systems
  • high dimensional
  • maximum number