Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability.
Javier Martín-MartínezJavier Diaz-FortunyPablo Saraza-CanflancaRosana RodríguezRafael Castro-LópezElisenda RocaFrancisco V. FernándezMontserrat NafríaPublished in: IRPS (2023)