Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits.
Javier Diaz-FortunyPablo Saraza-CanflancaRafael Castro-LópezElisenda RocaJavier Martín-MartínezRosana RodríguezFrancisco V. FernándezMontserrat NafríaPublished in: IEEE Trans. Instrum. Meas. (2020)